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X-Ray SpectrometryJournal Home
The journal "X-Ray Spectrometry (XRS)" covers the theory and application of X-ray emission spectrometry and spectroscopy, such as XRF, EPMA, SEM-EDX, PIXE, SR (synchrotron radiation)-XRF, and RI (radioisotope)-XRF. X-ray absorption (XAS, XAFS, EXAFS), X-ray scattering (Compton, Raman, elastic and inelastic), X-ray diffraction (XRD), X-ray reflection/refraction, and X-ray optics are also within the scope. XRS focuses on advances in techniques, methods, and instrumentations, including data handling, fundamental X-ray parameters, X-ray sources and detection devices, and sample preparation methods.
Publishing Model：
ISSN：0049-8246
|EISSN：1097-4539
|Publication Frequency：Seven times a year
|Last updated on 01 Jul 2026 / Current volume： 逦逦 / Current issue： 鋺
More Details
Optics
Analytical Chemistry
Environmental Quality Assessment and Environmental Monitoring
Impact Factor
Journal Impact Factor(JIF) 2024
声.逦
Journal Citation Indicator(JCI) 2024
蔡.逦杚
Web of Science Rank 2024:
偌鵝乊。穫葤鵣偌。鵣鵝巨
# 缗䟕/鋺鋺
35.23%
Q3
CiteScore Metrics
CiteScore 2024
杚.炆
=
炆缗䟕 Citation （2022-2024）
声篫杚 Article （2022-2024）
CiteScore Rank 2024
偌卖蠹桧锆㥌肃详桧肃卖续
# 鋺䟕/篫䟕
37.97%
Q3
